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chemical spectroscopy
Our expertise in solid state chemical analysis encompasses infrared and raman spectroscopy, surface chemical analysis and mass spectroscopy. Through the complementary nature of these techniques we can rapidly provide quantifiable identification of bulk and surface species down to better than ppm sensitivities from regions less than a micron square. The effects of processing on the chemical form and structure of API and formulated systems can be interpreted from the data allowing issues such as polymorphic form, amorphous content, surface coverage, degradation and enrichment to be resolved. |
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• ToF-SIMS (Time-of-Flight
Secondary Ion Mass Spectrometry)
• XPS (X-ray Photoelectron
Spectroscopy)
• FTIR (Fourier Transform Infrared
Spectroscopy)
• (Micro Attenuated Total
Reflectance FTIR)
• Infrared Microscopy
• Raman Spectroscopy
• CRM (Confocal Raman Microscopy)
• PXRD (Powder X-ray Diffraction)
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