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high resolution imaging
We combine high resolution imaging capabilities of optical and electron microscopy with the expert application of scanning probe microscopy to provide nanometre resolution images. These enabling technologies and our in-house methodology development afford quantitative assessment of physical properties such as morphology, size and material discrimination. Quantitative roughness analysis, in-situ particle sizing and discriminative imaging for example of crystalline and amorphous domains can be obtained beyond the single particle level. The ability to control environmental conditions as a function of solution, humidity and thermal conditioning, in-situ, enables dynamic processes to be visually resolved in-vitro. |
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• AFM (Atomic Force Microscopy)
• SThM (Scanning Thermal
Microscopy)
• CLSM (Confocal Laser Scanning
Microscopy)
• FE-SEM/ESEM
(Field Emission/Environmental
Scanning Electron Microscopy)
• X-ray micro-CT (X-ray micro-Computer
Tomography)
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